Gap junctions are formed between the opposing membranes of neighbouring cells. Hemichannels (connexons)on each side dock to one another to form conductive channels between the two cells. The main role of gap junctions is in the electrical synaptic transmission of the nervous system allowing direct and rapid communication between neurons. The measurement of the electrophysiological properties of gap junctions is carried out using the dual whole cell voltage clamp technique. The dual voltage clamp method is the common method to assay the electrical properties of gap junctions, such as junctional conductance and transjunctional voltage dependence.

Equipment:

• dual SEC-05 system w/ INST ITC-18, EPMS-7 modular system with SEC modules and INST ITC-18, or HEKA EPC-10/2
• HEKA PatchMaster
• dual Scientific PatchStar system
• KS 9100 series table